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Press

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Multiplexing UV-NIR Spectroscopy Measurements
Article from www.photonics.com (link)

Latest spectroscopy technology for wafer production
tec5 wins Cell Award 2009 (press release pdf)

UV/Vis/NIR Spectrometry for the Film Thickness Determination of Transparent Films and Layers
Article in analytica-world, March 2007 (direct link)

UV und NIR in Complete Length – News from the MultiSpec Spectrometer family
Press Release, June 2004 (13 kB as PDF)

Fast 16 Bit Electronics for Detector Array Spectrometers
Press Release, May 2004 (6 kB as PDF)